Effect of interface defects on electrical characteristics of a-ITGZO TFTs under bottom, top, and dual gatings

Autor: Kang, Mingu, Cho, Kyoungah, Seol, Minhyeok, Kim, Sangsub, Kim, Sangsig
Zdroj: In Heliyon 15 July 2024 10(13)
Databáze: ScienceDirect