Effect of interface defects on electrical characteristics of a-ITGZO TFTs under bottom, top, and dual gatings
Autor: | Kang, Mingu, Cho, Kyoungah, Seol, Minhyeok, Kim, Sangsub, Kim, Sangsig |
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Zdroj: | In Heliyon 15 July 2024 10(13) |
Databáze: | ScienceDirect |
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