A deep residual neural network for semiconductor defect classification in imbalanced scanning electron microscope datasets
| Autor: | López de la Rosa, Francisco, Gómez-Sirvent, José L., Morales, Rafael, Sánchez-Reolid, Roberto, Fernández-Caballero, Antonio |
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| Zdroj: | In Applied Soft Computing December 2022 131 |
| Databáze: | ScienceDirect |
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