Atom probe tomography analysis of InAlGaAs capped InAs/GaAs stacked quantum dots with variable barrier layer thickness
| Autor: | Hernández-Saz, J. *, Herrera, M., Molina, S.I., Stanley, C.R., Duguay, S. |
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| Zdroj: | In Acta Materialia 15 January 2016 103:651-657 |
| Databáze: | ScienceDirect |
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