Atom probe tomography analysis of InAlGaAs capped InAs/GaAs stacked quantum dots with variable barrier layer thickness
| Autor: | Hernández-Saz, J. a, *, Herrera, M. a, Molina, S.I. a, Stanley, C.R. b, Duguay, S. c |
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| Zdroj: | In Acta Materialia 15 January 2016 103:651-657 |
| Databáze: | ScienceDirect |
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