Method for system-independent material characterization from spectral X-ray CT
Autor: | Busi, Matteo, Mohan, K. Aditya, Dooraghi, Alex A., Champley, Kyle M., Martz, Harry E., Olsen, Ulrik L. |
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Zdroj: | In NDT and E International October 2019 107 |
Databáze: | ScienceDirect |
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