Method for system-independent material characterization from spectral X-ray CT

Autor:	Busi, Matteo a, b, *, Mohan, K. Aditya b, Dooraghi, Alex A. b, Champley, Kyle M. b, Martz, Harry E. b, Olsen, Ulrik L. a
Zdroj:	In NDT and E International October 2019 107
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect