Memory effects in MOS devices based on Si quantum dots

Autor: Crupi, I *, Corso, D, Lombardo, S, Gerardi, C, Ammendola, G, Nicotra, G, Spinella, C, Rimini, E, Melanotte, M
Zdroj: In Materials Science & Engineering C 15 January 2003 23(1-2):33-36
Databáze: ScienceDirect