Memory effects in MOS devices based on Si quantum dots
Autor: | Crupi, I *, Corso, D, Lombardo, S, Gerardi, C, Ammendola, G, Nicotra, G, Spinella, C, Rimini, E, Melanotte, M |
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Zdroj: | In Materials Science & Engineering C 15 January 2003 23(1-2):33-36 |
Databáze: | ScienceDirect |
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