Dose loss and segregation of boron and arsenic at the Si/SiO 2 interface by atomistic kinetic Monte Carlo simulations

Autor: Rubio, J.E., Jaraiz, M., Martin-Bragado, I., Castrillo, P., Pinacho, R., Barbolla, J.
Zdroj: In Materials Science & Engineering B 2005 124:392-396
Databáze: ScienceDirect