Structural characterization and electro-physical properties for SiOC(–H) low-k dielectric films

Autor: Zakirov, A.S., Khabibullaev, P.K., Choi, Chi Kyu
Zdroj: In Physica B: Physics of Condensed Matter 15 December 2009 404(23-24):5218-5220
Databáze: ScienceDirect