Structural characterization and electro-physical properties for SiOC(–H) low-k dielectric films
Autor: | Zakirov, A.S., Khabibullaev, P.K., Choi, Chi Kyu |
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Zdroj: | In Physica B: Physics of Condensed Matter 15 December 2009 404(23-24):5218-5220 |
Databáze: | ScienceDirect |
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