Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events
| Autor: | Russo, E. Di, Blum, I., Houard, J., Gilbert, M., Da Costa, G., Blavette, D., Rigutti, L. |
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| Zdroj: | In Ultramicroscopy April 2018 187:126-134 |
| Databáze: | ScienceDirect |
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