Characterization of planar flaws by an integrated approach using phased array and synthetic aperture focusing technique

Autor:	Nanekar, Paritosh, Jothilakshmi, N., Kumar, Anish, Jayakumar, T.
Zdroj:	In Measurement December 2019 147
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect