Characterization of planar flaws by an integrated approach using phased array and synthetic aperture focusing technique
| Autor: | Nanekar, Paritosh a, ⁎, Jothilakshmi, N. a, Kumar, Anish b, Jayakumar, T. c |
|---|---|
| Zdroj: | In Measurement December 2019 147 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect