Investigations on the origin of strain variation in the zinc-blende phase along the depth of GaP/Si(1 1 1) using spatially resolved polarized and wavelength dependent Raman spectroscopy

Autor:	Aggarwal, R., Ingale, Alka A., Dixit, V.K.
Zdroj:	In Applied Surface Science 1 June 2020 514
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect