Investigations on the origin of strain variation in the zinc-blende phase along the depth of GaP/Si(1 1 1) using spatially resolved polarized and wavelength dependent Raman spectroscopy
| Autor: | Aggarwal, R., Ingale, Alka A., Dixit, V.K. |
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| Zdroj: | In Applied Surface Science 1 June 2020 514 |
| Databáze: | ScienceDirect |
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