Reflow processes in micro-bumps studied by synchrotron X-ray projection nanotomography

Autor: Bertheau, J., Bleuet, P., Hodaj, F., Cloetens, P., Martin, N., Charbonnier, J., Hotellier, N.
Zdroj: In Microelectronic Engineering January 2014 113:123-129
Databáze: ScienceDirect