Reflow processes in micro-bumps studied by synchrotron X-ray projection nanotomography

Autor: Bertheau, J. a, b, ⁎, Bleuet, P. b, 1, Hodaj, F. c, 2, Cloetens, P. d, 3, Martin, N. a, b, 1, Charbonnier, J. b, 4, Hotellier, N. a, 5
Zdroj: In Microelectronic Engineering January 2014 113:123-129
Databáze: ScienceDirect