Nanoprober-based EBIC measurements for nanowire transistor structures
| Autor: | Arstila, K., Hantschel, T., Schulze, A., Vandooren, A., Verhulst, A.S., Rooyackers, R., Eyben, P., Vandervorst, W. |
|---|---|
| Zdroj: | In Microelectronic Engineering May 2013 105:99-102 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect