Influence of sputtering pressure on microstructure and layer properties of iridium thin films

Autor: Büttner, A., Probst, A.-C., Emmerich, F., Damm, C., Rellinghaus, B., Döhring, T., Stollenwerk, M.
Zdroj: In Thin Solid Films 30 September 2018 662:41-46
Databáze: ScienceDirect