Effects of annealing conditions and film thickness on electrical and optical properties of epitaxial Al-doped ZnO films
Autor: | Kuprenaite, S., Abrutis, A., Kubilius, V., Murauskas, T., Saltyte, Z., Plausinaitiene, V. |
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Zdroj: | In Thin Solid Films 29 January 2016 599:19-26 |
Databáze: | ScienceDirect |
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