Effects of annealing conditions and film thickness on electrical and optical properties of epitaxial Al-doped ZnO films

Autor: Kuprenaite, S., Abrutis, A., Kubilius, V., Murauskas, T., Saltyte, Z., Plausinaitiene, V.
Zdroj: In Thin Solid Films 29 January 2016 599:19-26
Databáze: ScienceDirect