Comparative analysis of the RF and noise performance of bulk and single-gate ultra-thin SOI MOSFETs by numerical simulation
Autor: | Eminente, Simone, Alessandrini, Marco, Fiegna, Claudio |
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Zdroj: | In Solid State Electronics 2004 48(4):543-549 |
Databáze: | ScienceDirect |
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