Prognosis of LED lumen degradation using Bayesian optimized neural network approach
Autor: | Pugalenthi, Karkulali, Lim, Sze Li Harry, Park, Hyunseok, Hussain, Shaista, Raghavan, Nagarajan |
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Zdroj: | In Microelectronics Reliability November 2022 138 |
Databáze: | ScienceDirect |
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