Prognosis of LED lumen degradation using Bayesian optimized neural network approach

Autor: Pugalenthi, Karkulali, Lim, Sze Li Harry, Park, Hyunseok, Hussain, Shaista, Raghavan, Nagarajan
Zdroj: In Microelectronics Reliability November 2022 138
Databáze: ScienceDirect