Physical origin of current collapse in Au-free AlGaN/GaN Schottky Barrier Diodes
| Autor: | Hu, J., Stoffels, S., Lenci, S., Ronchi, N., Venegas, R., You, S., Bakeroot, B., Groeseneken, G., Decoutere, S. |
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| Zdroj: | In Microelectronics Reliability September-October 2014 54(9-10):2196-2199 |
| Databáze: | ScienceDirect |
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