| Autor: |
Marcel Schloz, Johannes Müller, Thomas C. Pekin, Wouter Van den Broek, Jacob Madsen, Toma Susi, Christoph T. Koch |
| Jazyk: |
angličtina |
| Rok vydání: |
2023 |
| Předmět: |
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| Zdroj: |
Scientific Reports, Vol 13, Iss 1, Pp 1-10 (2023) |
| Druh dokumentu: |
article |
| ISSN: |
2045-2322 |
| DOI: |
10.1038/s41598-023-35740-1 |
| Popis: |
Abstract We present a method that lowers the dose required for an electron ptychographic reconstruction by adaptively scanning the specimen, thereby providing the required spatial information redundancy in the regions of highest importance. The proposed method is built upon a deep learning model that is trained by reinforcement learning, using prior knowledge of the specimen structure from training data sets. We show that using adaptive scanning for electron ptychography outperforms alternative low-dose ptychography experiments in terms of reconstruction resolution and quality. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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