Patterning single-layer materials by electrical breakdown using atomic force microscopy

Autor: Yajie Yang, Jiajia Lu, Yanbo Xie, Libing Duan
Jazyk: angličtina
Rok vydání: 2024
Předmět:
Zdroj: Nanotechnology and Precision Engineering, Vol 7, Iss 1, Pp 013008-013008-7 (2024)
Druh dokumentu: article
ISSN: 2589-5540
DOI: 10.1063/10.0023848
Popis: The development of nanoelectronics and nanotechnologies has been boosted significantly by the emergence of 2D materials because of their atomic thickness and peculiar properties, and developing a universal, precise patterning technology for single-layer 2D materials is critical for assembling nanodevices. Demonstrated here is a nanomachining technique using electrical breakdown by an AFM tip to fabricate nanopores, nanostrips, and other nanostructures on demand. This can be achieved by voltage scanning or applying a constant voltage while moving the tip. By measuring the electrical current, the formation process on single-layer materials was shown quantitatively. The present results provide evidence of successful pattern fabrication on single-layer MoS2, boron nitride, and graphene, although further confirmation is still needed. The proposed method holds promise as a general nanomachining technology for the future.
Databáze: Directory of Open Access Journals