Thermal variation apparatus for X-ray diffraction experiments up to 3000 K
Autor: | G Fug, H Gasparoux, J J Piaud |
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Rok vydání: | 1972 |
Předmět: | |
Zdroj: | Journal of Physics E: Scientific Instruments. 5:1222-1225 |
ISSN: | 0022-3735 |
DOI: | 10.1088/0022-3735/5/12/026 |
Popis: | Describes a thermal variation device for an X-ray diffractometer with a horizontal positioned goniometer. This experimental set-up allows one to observe X-ray patterns between room temperature and 3000 K; the sample temperature is regulated with an accuracy of the order of +or-5 degrees C by using an infrared pyrometer linked to a furnace stabilizing circuit. |
Databáze: | OpenAIRE |
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