Thermal variation apparatus for X-ray diffraction experiments up to 3000 K

Autor: G Fug, H Gasparoux, J J Piaud
Rok vydání: 1972
Předmět:
Zdroj: Journal of Physics E: Scientific Instruments. 5:1222-1225
ISSN: 0022-3735
DOI: 10.1088/0022-3735/5/12/026
Popis: Describes a thermal variation device for an X-ray diffractometer with a horizontal positioned goniometer. This experimental set-up allows one to observe X-ray patterns between room temperature and 3000 K; the sample temperature is regulated with an accuracy of the order of +or-5 degrees C by using an infrared pyrometer linked to a furnace stabilizing circuit.
Databáze: OpenAIRE