Autor:	Shui-Jinn Wang, Rong-Ming Ko, Hsiang Yi Chen, Zhi-Kai Zhuang, Sheng Tsang Hsiao, Bing Cheng You, Chun Kai Liao, Sheng Yi Wang
Rok vydání:	2018
Předmět:	Materials science business.industry Thin-film transistor Gate dielectric Optoelectronics Electrical stability business
Zdroj:	Extended Abstracts of the 2018 International Conference on Solid State Devices and Materials.
DOI:	10.7567/ssdm.2018.ps-10-04
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::f3dbd735392fc7ed1e3ae083fd4ae0ea https://doi.org/10.7567/ssdm.2018.ps-10-04 Zobrazit plný text záznamu