High-gain lateral bipolar action in a MOSFET structure

Autor: P.K. Ko, S. Simon Wong, S. Verdonckt-Vandebroek, Jason C. S. Woo
Rok vydání: 1991
Předmět:
Zdroj: IEEE Transactions on Electron Devices. 38:2487-2496
ISSN: 0018-9383
DOI: 10.1109/16.97413
Popis: A hybrid-mode device based on a standard submicrometer CMOS technology is presented. The device is essentially a MOSFET in which the gate and the well are internally connected to form the base of a lateral bipolar junction transistor (BJT). At low collector current levels, lateral bipolar action with a current gain higher than 1000 is achieved. No additional processing steps are needed to obtain the BJT when the MOSFET is properly designed. n-p-n BJTs with a 0.25- mu m base width have been successfully fabricated in a p-well 0.25- mu m bulk n-MOSFET process. The electrical characteristics of the n-MOSFET and the lateral n-p-n BJT at room and liquid nitrogen temperatures are reported. >
Databáze: OpenAIRE