Machine Vision Analysis for Multiplex Surface-Enhanced Raman Scattering Sensing
Autor: | Xingwei Hou, Kundan Sivashanmugan, Yong Zhao, Alan X. Wang |
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Rok vydání: | 2022 |
Zdroj: | Conference on Lasers and Electro-Optics. |
DOI: | 10.1364/cleo_si.2022.sth5j.2 |
Popis: | We report a multiplex sensing method by machine vision analysis of surface-enhanced Raman scattering coupled with thin layer chromatography. This machine vision method can detect five different analytes at 1 ppm concentration simultaneously. |
Databáze: | OpenAIRE |
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