Machine Vision Analysis for Multiplex Surface-Enhanced Raman Scattering Sensing

Autor: Xingwei Hou, Kundan Sivashanmugan, Yong Zhao, Alan X. Wang
Rok vydání: 2022
Zdroj: Conference on Lasers and Electro-Optics.
DOI: 10.1364/cleo_si.2022.sth5j.2
Popis: We report a multiplex sensing method by machine vision analysis of surface-enhanced Raman scattering coupled with thin layer chromatography. This machine vision method can detect five different analytes at 1 ppm concentration simultaneously.
Databáze: OpenAIRE