Use Of Expert Systems In Photolithography

Autor: Terry Cline, Wendy Fong
Rok vydání: 1987
Předmět:
Zdroj: SPIE Proceedings.
ISSN: 0277-786X
DOI: 10.1117/12.940438
Popis: Expert systems for photolithography or photolithography-related domains are being built by many semiconductor chip manufacturers, fabrication equipment manufacturers, and university groups. This paper describes several such applications for process control, diagnosis, automation, design, simulation, planning, and scheduling. Benefits and implementation issues are highlighted.
Databáze: OpenAIRE