Use Of Expert Systems In Photolithography
Autor: | Terry Cline, Wendy Fong |
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Rok vydání: | 1987 |
Předmět: | |
Zdroj: | SPIE Proceedings. |
ISSN: | 0277-786X |
DOI: | 10.1117/12.940438 |
Popis: | Expert systems for photolithography or photolithography-related domains are being built by many semiconductor chip manufacturers, fabrication equipment manufacturers, and university groups. This paper describes several such applications for process control, diagnosis, automation, design, simulation, planning, and scheduling. Benefits and implementation issues are highlighted. |
Databáze: | OpenAIRE |
Externí odkaz: |