New measurement-based technique for RF LDMOS nonlinear modeling
Autor: | Juan-Mari Collantes, Raymond Quéré, J.J. Raoux, Almudena Suarez |
---|---|
Rok vydání: | 1998 |
Předmět: | |
Zdroj: | IEEE Microwave and Guided Wave Letters. 8:345-347 |
ISSN: | 1051-8207 |
DOI: | 10.1109/75.735416 |
Popis: | In this letter a new look-up table model is developed for the nonlinear modeling of radio frequency (RF) LDMOS transistors. The modeling technique is based on the use of approximation splines that are coupled to a pulsed I-V characterization setup. It provides a very fast modeling procedure, while avoiding the appearance of undesired ripples in the modeled functions. The technique has been applied to a RF LDMOS technology for L-band applications, obtaining excellent results in the prediction of both the small- and large-signal transistor responses. This technique is specially suitable for fast-evolution technologies. |
Databáze: | OpenAIRE |
Externí odkaz: |