Effect of process parameters on the microstructure and perpendicular magnetic properties of Co3Pt thin films
| Autor: | C.L. Shen, P.C. Kuo, S.C. Chen, C.D. Chen, S.L. Hsu, G.P. Lin, S.L. Ou, K.T. Huang |
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| Rok vydání: | 2011 |
| Předmět: |
Materials science
Perpendicular magnetic anisotropy Annealing (metallurgy) Metals and Alloys Analytical chemistry Surfaces and Interfaces Coercivity Microstructure Surfaces Coatings and Films Electronic Optical and Magnetic Materials Magnetic anisotropy Nuclear magnetic resonance Materials Chemistry Perpendicular Magnetic layer Thin film |
| Zdroj: | Thin Solid Films. 519:5199-5202 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/j.tsf.2011.01.111 |
| Popis: | A Co 3 Pt magnetic layer with a thickness of 7–28 nm was deposited onto a Pt underlayer. As-deposited Co 3 Pt/Pt double-layered films with or without a 5 nm Pt capping layer were annealed at temperatures between 275 and 375 °C. The results show that the out-of-plane coercivity (H c⊥ ) of Co 3 Pt films without a Pt capping layer is larger than that of Co 3 Pt films with a Pt capping layer after annealing. The H c⊥ of the film without a capping layer annealed at 300 °C increased as the thickness of the Co 3 Pt film increased, reaching a maximum H c⊥ value at 18 nm. Also, an 85 nm thick Tb 30 Co 70 film with high perpendicular magnetic anisotropy deposited on a Co 3 Pt(14 nm)/Pt(100 nm) double-layered film enhanced the H c⊥ and out-of-plane squareness (S ⊥ ) values of the Co 3 Pt film. |
| Databáze: | OpenAIRE |
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