Microstructural Evolution of Sol-Gel Derived PZT Thin Films

Autor: Cheng-Chen Hsueh, Martha L. Mecartney
Rok vydání: 1991
Předmět:
Zdroj: MRS Proceedings. 243
ISSN: 1946-4274
0272-9172
DOI: 10.1557/proc-243-451
Popis: Transmission electron microscopy (TEM) was used to investigate the microstructural evolution of sol-gel derived ferroelectric PZT films. Aggregates of perovskite crystals nucleated and grew out of a pyrochlore matrix at 550°C. A dense, single-phase perovskite PZT film was obtained by fast firing the film at 650°C for 30 minutes. The grain size of this film was approximately 0.2-0.4 μm. Hot-stage TEM observed disappearance of ferroelectric domains as the temperature approaching 325°C.
Databáze: OpenAIRE