Microstructural Evolution of Sol-Gel Derived PZT Thin Films
Autor: | Cheng-Chen Hsueh, Martha L. Mecartney |
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Rok vydání: | 1991 |
Předmět: | |
Zdroj: | MRS Proceedings. 243 |
ISSN: | 1946-4274 0272-9172 |
DOI: | 10.1557/proc-243-451 |
Popis: | Transmission electron microscopy (TEM) was used to investigate the microstructural evolution of sol-gel derived ferroelectric PZT films. Aggregates of perovskite crystals nucleated and grew out of a pyrochlore matrix at 550°C. A dense, single-phase perovskite PZT film was obtained by fast firing the film at 650°C for 30 minutes. The grain size of this film was approximately 0.2-0.4 μm. Hot-stage TEM observed disappearance of ferroelectric domains as the temperature approaching 325°C. |
Databáze: | OpenAIRE |
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