A rapid life-prediction approach for solder joints based on modified Engelmaier fatigue model

Autor: Zhou Guifa, Kuang Fen, Xu Wang, Yuxiong Pan
Rok vydání: 2020
Předmět:
Zdroj: Microelectronics Reliability. 114:113844
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2020.113844
Popis: Accelerated life test (ALT) is widely used to predict life of solder joints nowadays, and how to shorten the test time and improve the precise of evaluation is one of the most important issues. Based on statistical results of field failure for solder joints, improved ALT under combined thermal cycling and vibration loading conditions was designed and carried out. This paper presents a modified Engelmaier fatigue model to predict life of solder joints, by taking into account field failure data and ALT testing data. The results show that test time of improved ALT is more shorter than conventional one, and the result of remaining life prediction based on modified Engelmaier fatigue model becomes more precise due to improving life model and increasing information.
Databáze: OpenAIRE