History dependence of non-fully depleted (NFD) digital SOI circuits

Autor: F. Assaderaghi, G.G. Shahidi, M. Hargrove, K. Hathorn, H. Hovel, S. Kulkarni, W. Rausch, D. Sadana, D. Schepis, R. Schulz, D. Yee, J. Sun, R. Dennard, B. Davari
Rok vydání: 2002
Předmět:
Zdroj: 1996 Symposium on VLSI Technology. Digest of Technical Papers.
DOI: 10.1109/vlsit.1996.507817
Popis: In this paper we experimentally demonstrate that the switching speed of digital circuits built from Non-Fully Depleted (NFD) SOI MOSFETs show a time dependence. Using a very high-bandwidth setup and pulses as short as 1 nsec, the magnitude and range of this memory effect are determined. It is demonstrated that the propagation delay variations have switching-history, V/sub dd/, and L/sub eff/ dependence. The cause of this behavior is traced to the SOI MOSFET's floating body and the dynamic variations of its stored charge and potential.
Databáze: OpenAIRE