X-ray diffraction determination of the composition of In x Ga1 − x Sb solid solution

Autor: V. F. Pavlov, T. G. Yugova, G. V. Shepekina, Yu. N. Parkhomenko, A. A. Shlenskii
Rok vydání: 2010
Předmět:
Zdroj: Inorganic Materials. 46:1526-1528
ISSN: 1608-3172
0020-1685
DOI: 10.1134/s0020168510140098
Popis: A procedure to determine the composition of InxGa1 − xSb solid solution by X-ray diffraction is described. In order to calculate the indium content in a solid solution, an expression is proposed which relates the cell size of an undeformed layer with the dimensions of a tetragonally distorted unit cell of the layer under strain caused by a discrepancy in the dimensions of the layer and substrate lattices. The procedure yields results that well agree with measurements of the solid solution composition in a layer by energy dispersive spectroscopic control performed using an electron microscope.
Databáze: OpenAIRE
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