X-ray diffraction determination of the composition of In x Ga1 − x Sb solid solution
| Autor: | V. F. Pavlov, T. G. Yugova, G. V. Shepekina, Yu. N. Parkhomenko, A. A. Shlenskii |
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| Rok vydání: | 2010 |
| Předmět: |
Diffraction
Chemistry General Chemical Engineering Metals and Alloys Analytical chemistry chemistry.chemical_element Substrate (electronics) Composition (combinatorics) law.invention Inorganic Chemistry law X-ray crystallography Materials Chemistry Electron microscope Layer (electronics) Indium Solid solution |
| Zdroj: | Inorganic Materials. 46:1526-1528 |
| ISSN: | 1608-3172 0020-1685 |
| DOI: | 10.1134/s0020168510140098 |
| Popis: | A procedure to determine the composition of InxGa1 − xSb solid solution by X-ray diffraction is described. In order to calculate the indium content in a solid solution, an expression is proposed which relates the cell size of an undeformed layer with the dimensions of a tetragonally distorted unit cell of the layer under strain caused by a discrepancy in the dimensions of the layer and substrate lattices. The procedure yields results that well agree with measurements of the solid solution composition in a layer by energy dispersive spectroscopic control performed using an electron microscope. |
| Databáze: | OpenAIRE |
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