Characterization of Strain Relaxation Process during Ge Condensation by Synchrotron Microbeam X-ray Diffraction

Autor:	Yasuhiko Imai, Shigeru Kimura, Osami Sakata, Tomoyuki Inoue, Takayoshi Shimura, Daisuke Shimokawa, Takuji Hosoi, Heiji Watanabe
Rok vydání:	2008
Předmět:	Crystallography Materials science Strain (chemistry) law Condensation X-ray crystallography Relaxation process Microbeam Synchrotron law.invention Characterization (materials science)
Zdroj:	Extended Abstracts of the 2008 International Conference on Solid State Devices and Materials.
DOI:	10.7567/ssdm.2008.p-1-21l
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::68a8d42b5751603ac0a24b52324f7cec https://doi.org/10.7567/ssdm.2008.p-1-21l Zobrazit plný text záznamu