Modification of an EM6G electron microscope for X-ray microanalysis
Autor: | B. E. Storey, A. G. Fitzgerald |
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Rok vydání: | 1979 |
Předmět: | |
Zdroj: | Journal of Microscopy. 115:73-80 |
ISSN: | 0022-2720 |
DOI: | 10.1111/j.1365-2818.1979.tb00153.x |
Popis: | SUMMARY A dual purpose stage has been constructed for an EM6G 100 kV transmission electron microscope. With this stage the composition of thin films and bulk specimens can be determined by X-ray microanalysis. With thin films a change of specimen cartridge then enables a full analysis of crystal defects in the film to be made using tilt controls incorporated in the stage. Modifications to the stage to reduce background effects in X-ray microanalysis spectra are also described. The alternative use of this system in the bulk analysis of specimens by an X-ray fluorescence technique is also discussed. |
Databáze: | OpenAIRE |
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