| Autor: |
B. E. Storey, A. G. Fitzgerald |
| Rok vydání: |
1979 |
| Předmět: |
|
| Zdroj: |
Journal of Microscopy. 115:73-80 |
| ISSN: |
0022-2720 |
| DOI: |
10.1111/j.1365-2818.1979.tb00153.x |
| Popis: |
SUMMARY A dual purpose stage has been constructed for an EM6G 100 kV transmission electron microscope. With this stage the composition of thin films and bulk specimens can be determined by X-ray microanalysis. With thin films a change of specimen cartridge then enables a full analysis of crystal defects in the film to be made using tilt controls incorporated in the stage. Modifications to the stage to reduce background effects in X-ray microanalysis spectra are also described. The alternative use of this system in the bulk analysis of specimens by an X-ray fluorescence technique is also discussed. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
Plný text