Localization length of integrated multi-walled carbon nanotubes

Autor:	M. Rennau, Stefan E. Schulz, Thomas Gessner, Holger Fiedler, Sascha Hermann
Rok vydání:	2014
Předmět:	Condensed Matter::Materials Science Anderson localization Materials science Characteristic length law Physics::Medical Physics Wafer Electrical measurements Nanotechnology Carbon nanotube Composite material law.invention Characterization (materials science)
Zdroj:	IEEE International Interconnect Technology Conference.
DOI:	10.1109/iitc.2014.6831852
Popis:	We prepared CNT based vias on wafer scale. Based on the electrical characterization we extracted the localization length of the CNTs. While for short CNTs the classical transport regime is valid, the Anderson localization regime applies for longer CNTs. Supplementary the characteristic length scales were estimated based on the structure of the CNTs being in good agreement with the parameters extracted from the electrical measurements.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2b5a637dfd70b1fd7de3f987d87d7f80 https://doi.org/10.1109/iitc.2014.6831852 Zobrazit plný text záznamu