| Autor: |
David P. Vallett, Vladimir V. Talanov, Antonio Orozco, Daniel A. Bader, Nicolas Gagliolo, Jan Gaudestad |
| Rok vydání: |
2012 |
| Předmět: |
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| Zdroj: |
International Symposium for Testing and Failure Analysis. |
| ISSN: |
0890-1740 |
| DOI: |
10.31399/asm.cp.istfa2012p0017 |
| Popis: |
Space Domain Reflectometry (SDR) is a newly developed non-destructive failure analysis (FA) technique for localizing open defects in both packages and dies through mapping in space domain the magnetic field produced by a radio frequency (RF) current induced in the sample, herein the name Space Domain Reflectometry. The technique employs a scanning superconducting quantum interference device (SQUID) RF microscope operating over a frequency range from 60 to 200 MHz. In this paper we demonstrate that SDR is capable of locating defective micro bumps in a flip-chip device. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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